The STM32F10xxx microcontroller family embeds up to three advanced 12-bit ADCs (depending on the device) with a conversion time down to 1 μs. A self-calibration feature is provided to enhance ADC accuracy versus environmental condition changes.
Control systems are becoming increasingly dependent on digital processing and so require sensors able to provide direct digital inputs. Sensors based on time measurement, having outputs based on a frequency or phase, have an advantage over conventional analogue sensors in that their outputs can be measured directly in digital systems by pulse counting.
Most circuit designers are familiar with diode dynamiccharacteristics such as charge storage, voltage dependentcapacitance and reverse recovery time. Less commonlyacknowledged and manufacturer specifi ed is diode forwardturn-on time. This parameter describes the timerequired for a diode to turn on and clamp at its forwardvoltage drop. Historically, this extremely short time, unitsof nanoseconds, has been so small that user and vendoralike have essentially ignored it. It is rarely discussed andalmost never specifi ed. Recently, switching regulator clockrate and transition time have become faster, making diodeturn-on time a critical issue. Increased clock rates aremandated to achieve smaller magnetics size; decreasedtransition times somewhat aid overall effi ciency but areprincipally needed to minimize IC heat rise. At clock speedsbeyond about 1MHz, transition time losses are the primarysource of die heating.
A complete design for a data acquisition card for the IBM PC is detailed in this application note. Additionally, C language code is provided to allow sampling of data at speed of more than 20kHz. The speed limitation is strictly based on the execution speed of the "C" data acquisition loop. A "Turbo" XT can acquire data at speeds greater than 20kHz. Machines with 80286 and 80386 processors can go faster than 20kHz. The computer that was used as a test bed in this application was an XT running at 4.77MHz and therefore all system timing and acquisition time measurements are based on a 4.77MHz clock speed.
Sensors for pressure, load, temperature, acceleration andmany other physical quantities often take the form of aWheatstone bridge. These sensors can be extremely linearand stable over time and temperature. However, mostthings in nature are only linear if you don’t bend them toomuch. In the case of a load cell, Hooke’s law states that thestrain in a material is proportional to the applied stress—as long as the stress is nowhere near the material’s yieldpoint (the “point of no return” where the material ispermanently deformed).
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
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使用時鐘PLL的源同步系統時序分析一）回顧源同步時序計算Setup Margin = Min Clock Etch Delay – Max Data Etch Delay – Max Delay Skew – Setup TimeHold Margin = Min Data Etch Delay – Max Clock Etch Delay + Min Delay Skew + Data Rate – Hold Time下面解釋以上公式中各參數的意義：Etch Delay：與常說的飛行時間(Flight Time)意義相同，其值并不是從仿真直接得到，而是通過仿真結果的后處理得來。請看下面圖示：圖一為實際電路，激勵源從輸出端，經過互連到達接收端，傳輸延時如圖示Rmin，Rmax，Fmin，Fmax。圖二為對應輸出端的測試負載電路，測試負載延時如圖示Rising，Falling。通過這兩組值就可以計算得到Etch Delay 的最大和最小值。
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