Photodiodes can be broken into two categories: largearea photodiodes with their attendant high capacitance(30pF to 3000pF) and smaller area photodiodes withrelatively low capacitance (10pF or less). For optimalsignal-to-noise performance, a transimpedance amplifi erconsisting of an inverting op amp and a feedback resistoris most commonly used to convert the photodiode currentinto voltage. In low noise amplifi er design, large areaphotodiode amplifi ers require more attention to reducingop amp input voltage noise, while small area photodiodeamplifi ers require more attention to reducing op amp inputcurrent noise and parasitic capacitances.
上傳時間： 2013-10-28
上傳用戶：hanbeidang
Most circuit designers are familiar with diode dynamiccharacteristics such as charge storage, voltage dependentcapacitance and reverse recovery time. Less commonlyacknowledged and manufacturer specifi ed is diode forwardturn-on time. This parameter describes the timerequired for a diode to turn on and clamp at its forwardvoltage drop. Historically, this extremely short time, unitsof nanoseconds, has been so small that user and vendoralike have essentially ignored it. It is rarely discussed andalmost never specifi ed. Recently, switching regulator clockrate and transition time have become faster, making diodeturn-on time a critical issue. Increased clock rates aremandated to achieve smaller magnetics size; decreasedtransition times somewhat aid overall effi ciency but areprincipally needed to minimize IC heat rise. At clock speedsbeyond about 1MHz, transition time losses are the primarysource of die heating.
上傳時間： 2013-10-10
上傳用戶：誰偷了我的麥兜
Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.
標簽： Converters Defini DAC
上傳時間： 2013-10-30
上傳用戶：stvnash
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上傳時間： 2013-11-12
上傳用戶：pans0ul
數字與模擬電路設計技巧IC與LSI的功能大幅提升使得高壓電路與電力電路除外，幾乎所有的電路都是由半導體組件所構成，雖然半導體組件高速、高頻化時會有EMI的困擾，不過為了充分發揮半導體組件應有的性能，電路板設計與封裝技術仍具有決定性的影響。 模擬與數字技術的融合由于IC與LSI半導體本身的高速化，同時為了使機器達到正常動作的目的，因此技術上的跨越競爭越來越激烈。雖然構成系統的電路未必有clock設計，但是毫無疑問的是系統的可靠度是建立在電子組件的選用、封裝技術、電路設計與成本，以及如何防止噪訊的產生與噪訊外漏等綜合考慮。機器小型化、高速化、多功能化使得低頻/高頻、大功率信號/小功率信號、高輸出阻抗/低輸出阻抗、大電流/小電流、模擬/數字電路，經常出現在同一個高封裝密度電路板，設計者身處如此的環境必需面對前所未有的設計思維挑戰，例如高穩定性電路與吵雜(noisy)性電路為鄰時，如果未將噪訊入侵高穩定性電路的對策視為設計重點，事后反復的設計變更往往成為無解的夢魘。模擬電路與高速數字電路混合設計也是如此，假設微小模擬信號增幅后再將full scale 5V的模擬信號，利用10bit A/D轉換器轉換成數字信號，由于分割幅寬祇有4.9mV，因此要正確讀取該電壓level并非易事，結果造成10bit以上的A/D轉換器面臨無法順利運作的窘境。另一典型實例是使用示波器量測某數字電路基板兩點相隔10cm的ground電位，理論上ground電位應該是零，然而實際上卻可觀測到4.9mV數倍甚至數十倍的脈沖噪訊(pulse noise)，如果該電位差是由模擬與數字混合電路的grand所造成的話，要測得4.9 mV的信號根本是不可能的事情，也就是說為了使模擬與數字混合電路順利動作，必需在封裝與電路設計有相對的對策，尤其是數字電路switching時，ground vance noise不會入侵analogue ground的防護對策，同時還需充分檢討各電路產生的電流回路(route)與電流大小，依此結果排除各種可能的干擾因素。以上介紹的實例都是設計模擬與數字混合電路時經常遇到的瓶頸，如果是設計12bit以上A/D轉換器時，它的困難度會更加復雜。
上傳時間： 2013-11-16
上傳用戶：731140412
半導體的產品很多，應用的場合非常廣泛，圖一是常見的幾種半導體元件外型。半導體元件一般是以接腳形式或外型來劃分類別，圖一中不同類別的英文縮寫名稱原文為 PDID：Plastic Dual Inline Package SOP：Small Outline Package SOJ：Small Outline J-Lead Package PLCC：Plastic Leaded Chip Carrier QFP：Quad Flat Package PGA：Pin Grid Array BGA：Ball Grid Array 雖然半導體元件的外型種類很多，在電路板上常用的組裝方式有二種，一種是插入電路板的銲孔或腳座，如PDIP、PGA，另一種是貼附在電路板表面的銲墊上，如SOP、SOJ、PLCC、QFP、BGA。 從半導體元件的外觀，只看到從包覆的膠體或陶瓷中伸出的接腳，而半導體元件真正的的核心，是包覆在膠體或陶瓷內一片非常小的晶片，透過伸出的接腳與外部做資訊傳輸。圖二是一片EPROM元件，從上方的玻璃窗可看到內部的晶片，圖三是以顯微鏡將內部的晶片放大，可以看到晶片以多條銲線連接四周的接腳，這些接腳向外延伸並穿出膠體，成為晶片與外界通訊的道路。請注意圖三中有一條銲線從中斷裂，那是使用不當引發過電流而燒毀，致使晶片失去功能，這也是一般晶片遭到損毀而失效的原因之一。 圖四是常見的LED，也就是發光二極體，其內部也是一顆晶片，圖五是以顯微鏡正視LED的頂端，可從透明的膠體中隱約的看到一片方型的晶片及一條金色的銲線，若以LED二支接腳的極性來做分別，晶片是貼附在負極的腳上，經由銲線連接正極的腳。當LED通過正向電流時，晶片會發光而使LED發亮，如圖六所示。 半導體元件的製作分成兩段的製造程序，前一段是先製造元件的核心─晶片，稱為晶圓製造；後一段是將晶中片加以封裝成最後產品，稱為IC封裝製程，又可細分成晶圓切割、黏晶、銲線、封膠、印字、剪切成型等加工步驟，在本章節中將簡介這兩段的製造程序。
上傳時間： 2014-01-20
上傳用戶：蒼山觀海
Linear Technology’s high performance battery management ICsenable long battery life and run time, while providing precision charging control, constantstatus monitoring and stringent battery protection. Our proprietary design techniques seamlesslymanage multiple input sources while providing small solution footprints, faster charging and100% standalone operation. Battery and circuit protection features enable improved thermalperformance and high reliability operation.
上傳時間： 2013-10-13
上傳用戶：yyq123456789
精確度0.05%滿刻度±1位數（Accuracy 0.05%F.S.±1digit） 可測量交直流電流/交直流電壓/電位計/傳送器/Pt-100/荷重元/電阻等信號（Measuring DCA/DCV/ACA/ACV/Potentiometer/Transmitter/Pt-100/Load Cell/Resistor/etc……） 顯示范圍0-19999可任意規劃（Programmable rate 0 to 1999 digit） 小數點可任意規劃（Decimal point can be modified） 尺寸小，穩定性高（Dimension small & High stability）
上傳時間： 2014-01-25
上傳用戶：RQB123
特點（FEATURES） 精確度0.1%滿刻度（Accuracy 0.1%F.S.） 多種輸入輸出選擇（Wide selection of input/output range） 三線式接線自動補償線路阻抗效應（3 wire configuration automatically compensate line resistance effects） 寬范圍交直流兩用電源設計（Wide input range for auxiliary power） 尺寸小，穩定性高（Dimension small & High stability）
上傳時間： 2013-10-17
上傳用戶：Huge_Brother
特點（FEATURES） 精確度0.1%滿刻度（Accuracy 0.1%F.S.） 寬輸入范圍200ohm 至 50Kohm（Wide inpuet ranges from 200ohm to 50Kohm） 多種輸入輸出選擇（Wide selection of input/output range） 輸入與輸出1/輸出2絕緣耐壓 2仟伏特/1分鐘（Dielectric strength 2KVac/1min.（input/output1/output2）） 寬范圍交直流兩用電源設計（Wide input range for auxiliary power） 尺寸小，穩定性高（Dimension small & High stability）
上傳時間： 2013-10-28
上傳用戶：sardinescn
