This a camera timer application for Series 60 devices Nokia 7650 and Nokia 3650. To test this application on Series 60 SDK v1.0, please install camera pictures. To do this, you can download "CameraImages.zip" from Forum Nokia s Web site.
標(biāo)簽： Nokia application devices Series
上傳時(shí)間： 2016-07-28
上傳用戶：hongmo
基于拓?fù)渑判虻呐耪n程序 vc.net2003編寫。 課程保存在c盤根目錄下test.txt
上傳時(shí)間： 2013-12-23
上傳用戶：dyctj
hello,this is a case of SIP test phone .
標(biāo)簽： hello phone case this
上傳時(shí)間： 2014-01-08
上傳用戶：litianchu
A good automatic increase plus a link to the procedure, test a success rate of 80％
標(biāo)簽： automatic procedure increase success
上傳時(shí)間： 2013-12-30
上傳用戶：15071087253
Introduction: 1. Macro1: AddFailureModeCol is used to the test report generated from GNPO Rpt Tools i. You can just open the test report, apply AddFailureModeCol 2. Macro2: DPHU_Match is for the test report after meeting i. You open the DPHU_Format_26Dec.xls, then apply DPHU_Match, after the program starts to run, you select the after-meeting test report from which you want to generate a dphu report. ii. Use “Save As” instead of “Save” to save the generated dphu report. Because later on you still want to use the DPHU_Format_26Dec.xls as a template.
標(biāo)簽： AddFailureModeCol Introduction generated Macro1
上傳時(shí)間： 2016-08-09
上傳用戶：爺?shù)臍赓|(zhì)
xvid test file xvid test file
上傳時(shí)間： 2016-08-10
上傳用戶：jcljkh
scsi test demo scsi test demo
上傳時(shí)間： 2013-12-02
上傳用戶：nairui21
NA, just the test file only, please don t download it
標(biāo)簽： download please just file
上傳時(shí)間： 2013-12-17
上傳用戶：朗朗乾坤
Taiwan sunplus develop spce3200, it is a test program ----- testboard source code
標(biāo)簽： testboard sunplus develop program
上傳時(shí)間： 2013-12-22
上傳用戶：yzy6007
OPEN-JTAG ARM JTAG 測(cè)試原理 1 前言 本篇報(bào)告主要介紹ARM JTAG測(cè)試的基本原理?；镜膬?nèi)容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介紹，在此基礎(chǔ)上，結(jié)合ARM7TDMI詳細(xì)介紹了的JTAG測(cè)試原理。 2 IEEE Standard 1149.1 - Test Access Port and Boundary-Scan Architecture 從IEEE的JTAG測(cè)試標(biāo)準(zhǔn)開(kāi)始，JTAG是JOINT TEST ACTION GROUP的簡(jiǎn)稱。IEEE 1149.1標(biāo)準(zhǔn)最初是由JTAG這個(gè)組織提出，最終由IEEE批準(zhǔn)並且標(biāo)準(zhǔn)化，所以，IEEE 1149.1這個(gè)標(biāo)準(zhǔn)一般也俗稱JTAG測(cè)試標(biāo)準(zhǔn)。 接下來(lái)介紹TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的基本架構(gòu)。
標(biāo)簽： JTAG BOUNDARY-SCAN OPEN-JTAG ARM
上傳時(shí)間： 2016-08-16
上傳用戶：sssl
蟲(chóng)蟲(chóng)下載站版權(quán)所有 京ICP備2021023401號(hào)-1
