隨著半導體工藝的飛速發展和芯片設計水平的不斷進步，ARM微處理器的性能得到大幅度地提高，同時其芯片的價格也在不斷下降，嵌入式系統以其獨有的優勢，己經廣泛地滲透到科學研究和日常生活的各個方面。 本文以ARM7 LPC2132處理器為核心，結合蓋革一彌勒計數管對Time-To-Count輻射測量方法進行研究。ARM結構是基于精簡指令集計算機(RISC)原理而設計的，其指令集和相關的譯碼機制比復雜指令集計算機要簡單得多，使用一個小的、廉價的ARM微處理器就可實現很高的指令吞吐量和實時的中斷響應。基于ARM7TDMI-S核的LPC2132微處理器，其工作頻率可達到60MHz，這對于Time-To-Count技術是非常有利的，而且利用LPC2132芯片的定時/計數器引腳捕獲功能，可以直接讀取TC中的計數值，也就是說不再需要調用中斷函數讀取TC值，從而大大降低了計數前雜質時間。本文是在我師兄呂軍的《Time-To-Count測量方法初步研究》基礎上，使用了高速的ARM芯片，對基于MCS-51的Time-To-Count輻射測量系統進行了改進，進一步論證了采用高速ARM處理器芯片可以極大的提高G-M計數器的測量范圍與測量精度。 首先，討論了傳統的蓋革-彌勒計數管探測射線強度的方法，并指出傳統的脈沖測量方法的不足。然后討論了什么是Time-To-Count測量方法，對Time-To-Count測量方法的理論基礎進行分析。指出Time-To-Count方法與傳統的脈沖計數方法的區別，以及采用Time-To-Count方法進行輻射測量的可行性。 接著，詳細論述基于ARM7 LPC2132處理器的Time-To-Count輻射測量儀的原理、功能、特點以及輻射測量儀的各部分接口電路設計及相關程序的編制。 最后得出結論，通過高速32位ARM處理器的使用，Time-To-Count輻射測量儀的精度和量程均得到很大的提高，對于Y射線總量測量，使用了ARM處理器的Time-To-Count輻射測量儀的量程約為20 u R/h到1R/h，數據線性程度也比以前的Time-To-CotJnt輻射測量儀要好。所以在使用Time-To-Count方法進行的輻射測量時，如何減少雜質時間以及如何提高計數前時間的測量精度，是決定Time-To-Count輻射測量儀性能的關鍵因素。實驗用三只相同型號的J33G-M計數管分別作為探測元件，在100U R/h到lR/h的輻射場中進行試驗.每個測量點測量5次取平均，得出隨著照射量率的增大，輻射強度R的測量值偏小且與輻射真實值之間的誤差也隨之增大。如果將測量誤差限定在10％的范圍內，則此儀器的量程范圍為20 u R/h至1R/h，量程跨度近六個數量級。而用J33型G-M計數管作常規的脈沖測量，量程范圍約為50 u R/h到5000 u R/h，充分體現了運用Time-To-Count方法測量輻射強度的優越性，也從另一個角度反應了隨著計數前時間的逐漸減小，雜質時間在其中的比重越來越大，對測量結果的影響也就越來越嚴重，盡可能的減小雜質時間在Time-To-Count方法輻射測量特別是測量高強度輻射中是關鍵的。筆者用示波器測出此輻射儀器的雜質時間約為6.5 u S，所以在計算定時器值的時候減去這個雜質時間，可以增加計數前時間的精確度。通過實驗得出，在標定儀器的K值時，應該在照射量率較低的條件下行，而測得的計數前時間是否精確則需要在照射量率較高的條件下通過儀器標定來檢驗。這是因為在照射量率較低時，計數前時間較大，雜質時間對測量結果的影響不明顯，數據線斜率較穩定，適宜于確定標定系數K值，而在照射量率較高時，計數前時間很小，雜質時間對測量結果的影響較大，可以明顯的在數據線上反映出來，從而可以很好的反應出儀器的性能與量程。實驗證明了Time-To-Count測量方法中最為關鍵的環節就是如何對計數前時間進行精確測量。經過對大量實驗數據的分析，得到計數前時間中的雜質時間可分為硬件雜質時間和軟件雜質時間，并以軟件雜質時間為主，通過對程序進行合理優化，軟件雜質時間可以通過程序的改進而減少，甚至可以用數學補償的方法來抵消，從而可以得到比較精確的計數前時間，以此得到較精確的輻射強度值。對于本輻射儀，用戶可以選擇不同的工作模式來進行測量，當輻射場較弱時，通常采用規定次數測量的方式，在輻射場較強時，應該選用定時測量的方式。因為，當輻射場較弱時，如果用規定次數測量的方式，會浪費很多時間來采集足夠的脈沖信號。當輻射場較強時，由于輻射粒子很多，產生脈沖的頻率就很高，規定次數的測量會加大測量誤差，當選用定時測量的方式時，由于時間的相對加長，所以記錄的粒子數就相對的增加，從而提高儀器的測量精度。通過調研國內外先進核輻射測量儀器的發展現狀，了解到了目前最新的核輻射總量測量技術一Time-To-Count理論及其應用情況。論證了該新技術的理論原理，根據此原理，結合高速處理器ARM7 LPC2132，對以G-計數管為探測元件的Time-To-Count輻射測量儀進行設計。論文以實驗的方法論證了Time-To-Count原理測量核輻射方法的科學性，該輻射儀的量程和精度均優于以前以脈沖計數為基礎理論的MCS-51核輻射測量儀。該輻射儀具有量程寬、精度高、易操作、用戶界面友好等優點。用戶可以定期的對儀器的標定，來減小由于電子元件的老化對低儀器性能參數造成的影響，通過Time-To-Count測量方法的使用，可以極大拓寬G-M計數管的量程。就儀器中使用的J33型G-M計數管而言，G-M計數管廠家參考線性測量范圍約為50 u R/h到5000 u R/h，而用了Time-To-Count測量方法后，結合高速微處理器ARM7 LPC2132，此核輻射測量儀的量程為20 u R/h至1R/h。在允許的誤差范圍內，核輻射儀的量程比以前基于MCS-51的輻射儀提高了近200倍，而且精度也比傳統的脈沖計數方法要高，測量結果的線性程度也比傳統的方法要好。G-M計數管的使用壽命被大大延長。 綜上所述，本文取得了如下成果：對國內外Time-To-Count方法的研究現狀進行分析，指出了Time-To-Count測量方法的基本原理，并對Time-T0-Count方法理論進行了分析，推導出了計數前時間和兩個相鄰輻射粒子時間間隔之間的關系，從數學的角度論證了Time-To-Count方法的科學性。詳細說明了基于ARM 7 LPC2132的Time-To-Count輻射測量儀的硬件設計、軟件編程的過程，通過高速微處理芯片LPC2132的使用，成功完成了對基于MCS-51單片機的Time-To-Count測量儀的改進。改進后的輻射儀器具有量程寬、精度高、易操作、用戶界面友好等特點。本論文根據實驗結果總結出了Time-To-Count技術中的幾點關鍵因素，如：處理器的頻率、計數前時間、雜質時間、采樣次數和測量時間等，重點分析了雜質時間的組成以及引入雜質時間的主要因素等，對國內核輻射測量儀的研究具有一定的指導意義。
標簽： TimeToCount ARM 輻射測量儀
上傳時間： 2013-06-24
上傳用戶：pinksun9
FEATURES Unique 1-Wire interface requires only one port pin for communication Multidrop capability simplifies distributed temperature sensing applications Requires no external components Can be powered from data line. Power supply range is 3.0V to 5.5V Zero standby power required Measures temperatures from -55°C to +125°C. Fahrenheit equivalent is -67°F to +257°F ±0.5°C accuracy from -10°C to +85°C Thermometer resolution is programmable from 9 to 12 bits Converts 12-bit temperature to digital word in 750 ms (max.) User-definable, nonvolatile temperature alarm settings Alarm search command identifies and addresses devices whose temperature is outside of programmed limits (temperature alarm condition) Applications include thermostatic controls, industrial systems, consumer products, thermometers, or any thermally sensitive system
上傳時間： 2013-08-04
上傳用戶：CHENKAI
Abstract: Many digital devices incorporate analog circuits. For instance, microprocessors, applicationspecificintegrated circuits (ASICs), and field-programmable gate arrays (FPGAs) may have internalvoltage references, analog-to-digital converters (ADCs) or digital-to-analog converters (DACs). However,there are challenges when you integrate more analog onto a digital design. As with all things in life, inelectronics we must always trade one parameter for another, with the application dictating the propertrade-off of analog function. In this application note, we examine how the demand for economy of spaceand cost pushes analog circuits onto digital substrates, and what design challenges emerge.
上傳時間： 2013-11-17
上傳用戶：菁菁聆聽
Abstract: This design idea explains how to implement an 8-bit analog-to-digital converter (ADC), using a microcontroller
上傳時間： 2013-10-30
上傳用戶：愛死愛死
Abstract: The DS4830 optical microcontroller's analog-to-digital converter (ADC) offset can change with temperature and gainselection. However, the DS4830 allows users to measure the ADC internal offset. The measured ADC offset is added to the ADCoffset register to nullify the offset error. This application note demonstrates the DS4830's ADC internal offset calibration in theapplication program.
上傳時間： 2014-12-23
上傳用戶：萍水相逢
以某高速實時頻譜儀為應用背景，論述了5 Gsps采樣率的高速數據采集系統的構成和設計要點，著重分析了采集系統的關鍵部分高速ADC（analog to digital，模數轉換器）的設計、系統采樣時鐘設計、模數混合信號完整性設計、電磁兼容性設計和基于總線和接口標準（PCI Express）的數據傳輸和處理軟件設計。在實現了系統硬件的基礎上，采用Xilinx公司ISE軟件的在線邏輯分析儀（ChipScope Pro）測試了ADC和采樣時鐘的性能，實測表明整體指標達到設計要求。給出上位機對采集數據進行處理的結果，表明系統實現了數據的實時采集存儲功能。
上傳時間： 2014-11-26
上傳用戶：黃蛋的蛋黃
高速數字系統設計下載pdf:High-Speed Digital SystemDesign—A Handbook ofInterconnect Theory and DesignPracticesStephen H. HallGarrett W. HallJames A. McCallA Wiley-Interscience Publication JOHN WILEY & SONS, INC.New York • Chichester • Weinheim • Brisbane • Singapore • TorontoCopyright © 2000 by John Wiley & Sons, Inc.speeddigital systems at the platform level. The book walks the reader through everyrequired concept, from basic transmission line theory to digital timing analysis, high-speedmeasurement techniques, as well as many other topics. In doing so, a unique balancebetween theory and practical applications is achieved that will allow the reader not only tounderstand the nature of the problem, but also provide practical guidance to the solution.The level of theoretical understanding is such that the reader will be equipped to see beyondthe immediate practical application and solve problems not contained within these pages.Much of the information in this book has not been needed in past digital designs but isabsolutely necessary today. Most of the information covered here is not covered in standardcollege curricula, at least not in its focus on digital design, which is arguably one of the mostsignificant industries in electrical engineering.The focus of this book is on the design of robust high-volume, high-speed digital productssuch as computer systems, with particular attention paid to computer busses. However, thetheory presented is applicable to any high-speed digital system. All of the techniquescovered in this book have been applied in industry to actual digital products that have beensuccessfully produced and sold in high volume.Practicing engineers and graduate and undergraduate students who have completed basicelectromagnetic or microwave design classes are equipped to fully comprehend the theorypresented in this book. At a practical level, however, basic circuit theory is all thebackground required to apply the formulas in this book.
上傳時間： 2013-10-26
上傳用戶：縹緲
利用單片機具有的智能程序控制的特點，設計了基于STC89C52單片機的"二極管特性測試器"，可對二極管一般特性進行快速測試。通過穩定線性電流源給二極管加載恒定電流，然后由高精度模數轉換器測試其壓降，以此為基礎可判斷二極管好壞、檢測二極管極性和測試二極管伏安特性等，避免了用萬用表測試只能測得極性而不知其特性這一缺點。可用于電子設計制作過程中對二極管進行快速測試，以確定被測二極管是否滿足電路的設計要求。 Abstract: By making good use of the intelligent control function of the Micro Controller Unit (MCU)， the diode trait tester was designed based on the STC89C52，which could be used to test the trait of a diode rapidly. By loading constant current to diode through the stable linear current source， and measuring the voltage drop of the diode by high-precision analogue-to-digital converter (ADC)， it can judge whether the diode is good or not， distinguish the polarity of the diode， and test the trait that the diode， which can avoid the fault of using a multimeter can only measure the polarity but not the trait. This device can be used to test the trait of a diode quickly，and to make sure that whether a diode can be used in the electronic design or not.
上傳時間： 2013-11-13
上傳用戶：assef
Luminary Micro provides an analog-to-digital converter (ADC) module on some members of theStellaris microcontroller family. The hardware resolution of the ADC is 10 bits; however, due to noiseand other accuracy-diminishing factors, the true accuracy is less than 10 bits. This application noteprovides a software-based oversampling technique, resulting in an improved Effective Number OfBits (ENOB) in the conversion result. This document describes methods of oversampling an inputsignal, and the impact on precision and overall system performance.
標簽： Oversampling Techniques ADC fo
上傳時間： 2013-12-17
上傳用戶：zhyiroy
Luminary Micro Stellaris™ microcontrollers that are equipped with an analog-to-digital converter(ADC), use an innovative sequence-based sampling architecture designed to be extremely flexible,yet easy to use. This application note describes the sampling architecture of the ADC. Sinceprogrammers can configure Stellaris microcontrollers either through the powerful StellarisFamilyDriver Library or through direct writes to the device's control registers, this application note describesboth methods. The information presented in this document is intended to complement the ADCchapter of the device datasheet, and assumes the reader has a basic understanding of howADCsfunction.
標簽： Microcontr Stellaris Using the
上傳時間： 2013-10-14
上傳用戶：blans
