In the process of copper flash smelting, lining temperature of reaction shaft and its inner wall sluggish play a very important role in lining life. Up to now, however
標(biāo)簽: temperature smelting reaction process
上傳時(shí)間: 2015-10-03
上傳用戶:wang5829
初識(shí)java內(nèi)部類提起Java內(nèi)部類(inner Class)可能很多人不太熟悉,實(shí)際上類似的概念在C++里也有,那就是嵌套類(Nested Class),關(guān)于這兩者的區(qū)別與聯(lián)系,在下文中會(huì)有對(duì)比。
標(biāo)簽: inner Class java Java
上傳時(shí)間: 2014-12-04
上傳用戶:水口鴻勝電器
中軟國(guó)際Java程序員筆試題 1.談?wù)刦inal, finally, finalize的區(qū)別。 2.Anonymous inner Class (匿名內(nèi)部類) 是否可以extends(繼承)其它類,是否可以implements(實(shí)現(xiàn))interface(接口)? 3.Static Nested Class 和 inner Class的不同,說(shuō)得越多越好(面試題有的很籠統(tǒng))。
標(biāo)簽: Anonymous finalize extends finally
上傳時(shí)間: 2013-12-21
上傳用戶:離殤
談?wù)刦inal, finally, finalize的區(qū)別。Anonymous inner Class(匿名內(nèi)部類) 是否可以extends(繼承)其它類,是否可以implements(實(shí)現(xiàn))interface(接口)?
標(biāo)簽: Anonymous finalize extends finally
上傳時(shí)間: 2017-01-08
上傳用戶:ainimao
3G technology from huawei use in inner
標(biāo)簽: technology huawei inner from
上傳時(shí)間: 2013-12-01
上傳用戶:ddddddos
PCB LAYOUT 術(shù)語(yǔ)解釋(TERMS)1. COMPONENT SIDE(零件面、正面)︰大多數(shù)零件放置之面。2. SOLDER SIDE(焊錫面、反面)。3. SOLDER MASK(止焊膜面)︰通常指Solder Mask Open 之意。4. TOP PAD︰在零件面上所設(shè)計(jì)之零件腳PAD,不管是否鑽孔、電鍍。5. BOTTOM PAD:在銲錫面上所設(shè)計(jì)之零件腳PAD,不管是否鑽孔、電鍍。6. POSITIVE LAYER:?jiǎn)巍㈦p層板之各層線路;多層板之上、下兩層線路及內(nèi)層走線皆屬之。7. NEGATIVE LAYER:通常指多層板之電源層。8. inner PAD:多層板之POSITIVE LAYER 內(nèi)層PAD。9. ANTI-PAD:多層板之NEGATIVE LAYER 上所使用之絕緣範(fàn)圍,不與零件腳相接。10. THERMAL PAD:多層板內(nèi)NEGATIVE LAYER 上必須零件腳時(shí)所使用之PAD,一般稱為散熱孔或?qū)住?1. PAD (銲墊):除了SMD PAD 外,其他PAD 之TOP PAD、BOTTOM PAD 及inner PAD 之形狀大小皆應(yīng)相同。12. Moat : 不同信號(hào)的 Power& GND plane 之間的分隔線13. Grid : 佈線時(shí)的走線格點(diǎn)2. Test Point : ATE 測(cè)試點(diǎn)供工廠ICT 測(cè)試治具使用ICT 測(cè)試點(diǎn) LAYOUT 注意事項(xiàng):PCB 的每條TRACE 都要有一個(gè)作為測(cè)試用之TEST PAD(測(cè)試點(diǎn)),其原則如下:1. 一般測(cè)試點(diǎn)大小均為30-35mil,元件分布較密時(shí),測(cè)試點(diǎn)最小可至30mil.測(cè)試點(diǎn)與元件PAD 的距離最小為40mil。2. 測(cè)試點(diǎn)與測(cè)試點(diǎn)間的間距最小為50-75mil,一般使用75mil。密度高時(shí)可使用50mil,3. 測(cè)試點(diǎn)必須均勻分佈於PCB 上,避免測(cè)試時(shí)造成板面受力不均。4. 多層板必須透過(guò)貫穿孔(VIA)將測(cè)試點(diǎn)留於錫爐著錫面上(Solder Side)。5. 測(cè)試點(diǎn)必需放至於Bottom Layer6. 輸出test point report(.asc 檔案powerpcb v3.5)供廠商分析可測(cè)率7. 測(cè)試點(diǎn)設(shè)置處:Setuppadsstacks
標(biāo)簽: layout design pcb 硬件工程師
上傳時(shí)間: 2013-10-22
上傳用戶:pei5
With the Altera Nios II embedded processor, you as the system designercan accelerate time-critical software algorithms by adding custominstructions to the Nios II processor instruction set. Using custominstructions, you can reduce a complex sequence of standard instructionsto a single instruction implemented in hardware. You can use this featurefor a variety of applications, for example, to optimize software innerloops for digital signal processing (DSP), packet header processing, andcomputation-intensive applications. The Nios II configuration wizard,part of the Quartus® II software’s SOPC Builder, provides a graphicaluser interface (GUI) used to add up to 256 custom instructions to theNios II processor
上傳時(shí)間: 2013-11-07
上傳用戶:swing
Nios II定制指令用戶指南:With the Altera Nios II embedded processor, you as the system designer can accelerate time-critical software algorithms by adding custom instructions to the Nios II processor instruction set. Using custom instructions, you can reduce a complex sequence of standard instructions to a single instruction implemented in hardware. You can use this feature for a variety of applications, for example, to optimize software inner loops for digital signal processing (DSP), packet header processing, and computation-intensive applications. The Nios II configuration wizard,part of the Quartus® II software’s SOPC Builder, provides a graphical user interface (GUI) used to add up to 256 custom instructions to the Nios II processor. The custom instruction logic connects directly to the Nios II arithmetic logic unit (ALU) as shown in Figure 1–1.
上傳時(shí)間: 2013-10-12
上傳用戶:kang1923
PCB LAYOUT 術(shù)語(yǔ)解釋(TERMS)1. COMPONENT SIDE(零件面、正面)︰大多數(shù)零件放置之面。2. SOLDER SIDE(焊錫面、反面)。3. SOLDER MASK(止焊膜面)︰通常指Solder Mask Open 之意。4. TOP PAD︰在零件面上所設(shè)計(jì)之零件腳PAD,不管是否鑽孔、電鍍。5. BOTTOM PAD:在銲錫面上所設(shè)計(jì)之零件腳PAD,不管是否鑽孔、電鍍。6. POSITIVE LAYER:?jiǎn)巍㈦p層板之各層線路;多層板之上、下兩層線路及內(nèi)層走線皆屬之。7. NEGATIVE LAYER:通常指多層板之電源層。8. inner PAD:多層板之POSITIVE LAYER 內(nèi)層PAD。9. ANTI-PAD:多層板之NEGATIVE LAYER 上所使用之絕緣範(fàn)圍,不與零件腳相接。10. THERMAL PAD:多層板內(nèi)NEGATIVE LAYER 上必須零件腳時(shí)所使用之PAD,一般稱為散熱孔或?qū)住?1. PAD (銲墊):除了SMD PAD 外,其他PAD 之TOP PAD、BOTTOM PAD 及inner PAD 之形狀大小皆應(yīng)相同。12. Moat : 不同信號(hào)的 Power& GND plane 之間的分隔線13. Grid : 佈線時(shí)的走線格點(diǎn)2. Test Point : ATE 測(cè)試點(diǎn)供工廠ICT 測(cè)試治具使用ICT 測(cè)試點(diǎn) LAYOUT 注意事項(xiàng):PCB 的每條TRACE 都要有一個(gè)作為測(cè)試用之TEST PAD(測(cè)試點(diǎn)),其原則如下:1. 一般測(cè)試點(diǎn)大小均為30-35mil,元件分布較密時(shí),測(cè)試點(diǎn)最小可至30mil.測(cè)試點(diǎn)與元件PAD 的距離最小為40mil。2. 測(cè)試點(diǎn)與測(cè)試點(diǎn)間的間距最小為50-75mil,一般使用75mil。密度高時(shí)可使用50mil,3. 測(cè)試點(diǎn)必須均勻分佈於PCB 上,避免測(cè)試時(shí)造成板面受力不均。4. 多層板必須透過(guò)貫穿孔(VIA)將測(cè)試點(diǎn)留於錫爐著錫面上(Solder Side)。5. 測(cè)試點(diǎn)必需放至於Bottom Layer6. 輸出test point report(.asc 檔案powerpcb v3.5)供廠商分析可測(cè)率7. 測(cè)試點(diǎn)設(shè)置處:Setuppadsstacks
標(biāo)簽: layout design pcb 硬件工程師
上傳時(shí)間: 2013-11-17
上傳用戶:cjf0304
java語(yǔ)言中的面向?qū)ο筇匦裕悺?duì)象、面向?qū)ο蟮奶匦浴⒊橄箢悺⒔涌诤?b>inner Cla
上傳時(shí)間: 2013-12-18
上傳用戶:671145514
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