Most circuit designers are familiar with diode dynamiccharacteristics such as charge storage, voltage dependentcapacitance and reverse recovery time. Less commonlyacknowledged and manufacturer specifi ed is diode forwardturn-on time. This parameter describes the timerequired for a diode to turn on and clamp at its forwardvoltage drop. Historically, this extremely short time, unitsof nanoseconds, has been so small that user and vendoralike have essentially ignored it. It is rarely discussed andalmost never specifi ed. Recently, switching regulator clockrate and transition time have become faster, making diodeturn-on time a critical issue. Increased clock rates aremandated to achieve smaller magnetics size; decreasedtransition times somewhat aid overall effi ciency but areprincipally needed to minimize IC heat rise. At clock speedsbeyond about 1MHz, transition time losses are the primarysource of die heating.
Multiple-voltage electronics systems often requirecomplex supply voltage tracking or sequencing, whichif not met, can result in system faults or even permanentfailures in the fi eld. The design diffi culties in meetingthese requirements are often compounded in distributedpowerarchitectures where point-of-load (POL) DC/DCconverters or linear regulators are scattered across PCboard space, sometimes on different board planes. Theproblem is that power supply circuitry is often the lastcircuitry to be designed into the board, and it must beshoehorned into whatever little board real estate is left.Often, a simple, drop-in, fl exible solution is needed tomeet these requirements.
利用單片機具有的智能程序控制的特點，設計了基于STC89C52單片機的"二極管特性測試器"，可對二極管一般特性進行快速測試。通過穩定線性電流源給二極管加載恒定電流，然后由高精度模數轉換器測試其壓降，以此為基礎可判斷二極管好壞、檢測二極管極性和測試二極管伏安特性等，避免了用萬用表測試只能測得極性而不知其特性這一缺點。可用于電子設計制作過程中對二極管進行快速測試，以確定被測二極管是否滿足電路的設計要求。
Abstract:
By making good use of the intelligent control function of the Micro Controller Unit (MCU)， the diode trait tester was designed based on the STC89C52，which could be used to test the trait of a diode rapidly. By loading constant current to diode through the stable linear current source， and measuring the voltage drop of the diode by high-precision analogue-to-digital converter (ADC)， it can judge whether the diode is good or not， distinguish the polarity of the diode， and test the trait that the diode， which can avoid the fault of using a multimeter can only measure the polarity but not the trait. This device can be used to test the trait of a diode quickly，and to make sure that whether a diode can be used in the electronic design or not.
