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  • 常用D/A轉(zhuǎn)換器和A/D轉(zhuǎn)換器介紹

      常用D/A轉(zhuǎn)換器和A/D轉(zhuǎn)換器介紹   下面我們介紹一下其它常用D/A轉(zhuǎn)換器和 A/D 轉(zhuǎn)換器,便于同學(xué)們?cè)O(shè)計(jì)時(shí)使用。   1. DAC0808   圖 1 所示為權(quán)電流型 D/A 轉(zhuǎn)換器 DAC0808 的電路結(jié)構(gòu)框圖。用 DAC0808 這類器件構(gòu) 成的 D/A轉(zhuǎn)換器,需要外接運(yùn)算放大器和產(chǎn)生基準(zhǔn)電流用的電阻。DAC0808 構(gòu)成的典型應(yīng)用電路如圖2 所示。

    標(biāo)簽: 轉(zhuǎn)換器

    上傳時(shí)間: 2014-12-23

    上傳用戶:zhenyushaw

  • 4-20mA~0-5V兩通道模擬信號(hào)隔離采集A D轉(zhuǎn)換器

    isoad系列產(chǎn)品實(shí)現(xiàn)傳感器和主機(jī)之間的信號(hào)安全隔離和高精度數(shù)字采集與傳輸,廣泛應(yīng)用于rs-232/485總線工業(yè)自動(dòng)化控制系統(tǒng),4-20ma / 0-10v信號(hào)測(cè)量、監(jiān)視和控制,小信號(hào)的測(cè)量以及工業(yè)現(xiàn)場(chǎng)信號(hào)隔離及長(zhǎng)線傳輸?shù)冗h(yuǎn)程監(jiān)控場(chǎng)合。通過(guò)軟件的配置,可接入多種傳感器類型,包括電流輸出型、電壓輸出型、以及熱電偶等等。 產(chǎn)品內(nèi)部包括電源隔離,信號(hào)隔離、線性化,a/d轉(zhuǎn)換和rs-485串行通信等模塊。每個(gè)串口最多可接256只iso ad系列模塊,通訊方式采用ascii 碼字符通訊協(xié)議或modbus rtu通訊協(xié)議,其指令集兼容于adam模塊,波特率可由用戶設(shè)置,能與其他廠家的控制模塊掛在同一rs-485總線上,便于主機(jī)編程。 isoad系列產(chǎn)品是基于單片機(jī)的智能監(jiān)測(cè)和控制系統(tǒng),所有用戶設(shè)定的校準(zhǔn)值,地址,波特率,數(shù)據(jù)格式,校驗(yàn)和狀態(tài)等配置信息都儲(chǔ)存在非易失性存儲(chǔ)器eeprom里。 isoad系列產(chǎn)品按工業(yè)標(biāo)準(zhǔn)設(shè)計(jì)、制造,信號(hào)輸入 / 輸出之間隔離,可承受3000vdc隔離電壓,抗干擾能力強(qiáng),可靠性高。工作溫度范圍- 45℃~+80℃。

    標(biāo)簽: 20 mA D轉(zhuǎn)換 模擬信號(hào)

    上傳時(shí)間: 2013-11-23

    上傳用戶:comer1123

  • 高精度Delta-Sigma A/D轉(zhuǎn)換器原理及其應(yīng)用

    本次在線座談主要介紹TI的高精度Delta-Sigma A/D轉(zhuǎn)換器的原理及其應(yīng)用,Delta-Sigma A/D轉(zhuǎn)換器在稱重儀器中,大量采用比例測(cè)量方法。

    標(biāo)簽: Delta-Sigma 高精度 轉(zhuǎn)換器

    上傳時(shí)間: 2013-10-17

    上傳用戶:zhqzal1014

  • STM32F10xxx設(shè)備中如何得到高精度ADC

    The STM32F10xxx microcontroller family embeds up to three advanced 12-bit ADCs (depending on the device) with a conversion time down to 1 μs. A self-calibration feature is provided to enhance ADC accuracy versus environmental condition changes.

    標(biāo)簽: STM 32F F10 ADC

    上傳時(shí)間: 2014-12-23

    上傳用戶:eastimage

  • DAC技術(shù)用語(yǔ) (D/A Converters Defini

    Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.

    標(biāo)簽: Converters Defini DAC

    上傳時(shí)間: 2013-10-30

    上傳用戶:stvnash

  • ADC轉(zhuǎn)換器技術(shù)用語(yǔ) (A/D Converter Defi

    ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.

    標(biāo)簽: Converter Defi ADC 轉(zhuǎn)換器

    上傳時(shí)間: 2013-11-12

    上傳用戶:pans0ul

  • CV181L-A-20_Specification_V1.0(大功放)

    cv181l-a-20

    標(biāo)簽: Specification_V 181 1.0 L-A

    上傳時(shí)間: 2013-11-14

    上傳用戶:daijun20803

  • pci e PCB設(shè)計(jì)規(guī)范

    This document provides practical, common guidelines for incorporating PCI Express interconnect layouts onto Printed Circuit Boards (PCB) ranging from 4-layer desktop baseboard designs to 10- layer or more server baseboard designs. Guidelines and constraints in this document are intended for use on both baseboard and add-in card PCB designs. This includes interconnects between PCI Express devices located on the same baseboard (chip-to-chip routing) and interconnects between a PCI Express device located “down” on the baseboard and a device located “up” on an add-in card attached through a connector. This document is intended to cover all major components of the physical interconnect including design guidelines for the PCB traces, vias and AC coupling capacitors, as well as add-in card edge-finger and connector considerations. The intent of the guidelines and examples is to help ensure that good high-speed signal design practices are used and that the timing/jitter and loss/attenuation budgets can also be met from end-to-end across the PCI Express interconnect. However, while general physical guidelines and suggestions are given, they may not necessarily guarantee adequate performance of the interconnect for all layouts and implementations. Therefore, designers should consider modeling and simulation of the interconnect in order to ensure compliance to all applicable specifications. The document is composed of two main sections. The first section provides an overview of general topology and interconnect guidelines. The second section concentrates on physical layout constraints where bulleted items at the beginning of a topic highlight important constraints, while the narrative that follows offers additional insight.  

    標(biāo)簽: pci PCB 設(shè)計(jì)規(guī)范

    上傳時(shí)間: 2013-10-15

    上傳用戶:busterman

  • 2012TI杯陜西賽題-A微弱信號(hào)檢測(cè)裝置

    2012TI杯陜西賽題H題,2012TI杯陜西賽題-A微弱信號(hào)檢測(cè)裝置.

    標(biāo)簽: 2012 TI 微弱信號(hào) 檢測(cè)裝置

    上傳時(shí)間: 2013-12-17

    上傳用戶:362279997

  • 2011全國(guó)大賽A題開(kāi)關(guān)電源模塊并聯(lián)供電系統(tǒng)

    2011全國(guó)大賽A題開(kāi)關(guān)電源模塊并聯(lián)供電系統(tǒng)

    標(biāo)簽: 2011 大賽 開(kāi)關(guān)電源模塊 并聯(lián)供電系統(tǒng)

    上傳時(shí)間: 2013-11-10

    上傳用戶:冇尾飛鉈

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