在深入了解Flash存儲(chǔ)器的基礎(chǔ)上，采用單片機(jī)自動(dòng)檢測(cè)存儲(chǔ)器無(wú)效塊。主要通過(guò)讀取每一塊的第1、第2頁(yè)內(nèi)容，判斷該塊的好壞，并給出具體的實(shí)現(xiàn)過(guò)程，以及部分關(guān)鍵的電路原理圖和C語(yǔ)言程序代碼。該設(shè)計(jì)最終實(shí)現(xiàn)單片機(jī)自動(dòng)檢測(cè)Flash壞塊的功能，并通過(guò)讀取ID號(hào)檢測(cè)Flash的性能，同時(shí)該設(shè)計(jì)能夠存儲(chǔ)和讀取1GB數(shù)據(jù)。 Abstract: On the basis of in-depth understanding the Flash chips，this paper designs a new program which using the SCM to detect the invalid block.Mainly through reading the data of the first and second page to detect the invalid block.Specific implementation procedure was given,and the key circuit schematic diagram and C language program code was introduced.This design achieved the function of using the MCU checks the invalid block finally，and increased the function by reading the ID number of Flash to get the performance of the memory.And the design also can write and read1GB data
標(biāo)簽： Flash 單片機(jī) 存儲(chǔ)器 自動(dòng)檢測(cè)
上傳時(shí)間： 2013-10-25
上傳用戶：taozhihua1314
設(shè)計(jì)一種基于P89V51RD2的功率因數(shù)測(cè)量?jī)x，采用光電隔離器和專用數(shù)碼管驅(qū)動(dòng)器。該測(cè)量?jī)x是以增強(qiáng)型單片機(jī)P89V51RD2為核心，大大簡(jiǎn)化系統(tǒng)硬件設(shè)計(jì)。而軟件部分采用模塊化設(shè)計(jì)思想，采用中值濾波和小數(shù)補(bǔ)償算法，實(shí)現(xiàn)功率因數(shù)的高精度測(cè)量。實(shí)驗(yàn)測(cè)試表明，該功率因數(shù)測(cè)量?jī)x測(cè)量精度高，運(yùn)行穩(wěn)定可靠。 Abstract: A power－factor measurement instrument based on P89V51RD2is designed，which uses optical coupler and specific LED drive chip.The power factor measurement instrument uses P89V51RD2as a core of which greatly simplifies the system design.Furthermore，modularization software is developed in detail.The high precision power－factor measuring system is realized by the center value filter and fractional compensation algorithm.Experiments manifests that the power－ factor measurement instrument is high precision，steady and reliable.
上傳時(shí)間： 2014-12-27
上傳用戶：CHINA526
針對(duì)目前燃?xì)庠钍袌?chǎng)的狀況，提出一種基于PIC16C711單片機(jī)的燃?xì)庠蠲}沖點(diǎn)火控制器設(shè)計(jì),具體包括有系統(tǒng)的組成和功能介紹、硬件電路設(shè)計(jì)及軟件功能實(shí)現(xiàn)。 Abstract: Aiming at today’s gas cooker market, a pulse ignition controler design based on PIC16C711 is presented.The specific descriptions of system components and functions,hardware circuit design and software function are given.
上傳時(shí)間： 2013-10-31
上傳用戶：zhqzal1014
PICKIT™ 2 PROGRAMMER-TO-GO USER GUIDE The PICkit 2 Programmer-To-Go functionality allows a PIC MCU memory image to be downloaded into the PICkit 2 unit for later programming into a specific PIC MCU. No software or PC is required to program devices once the PICkit 2 unit is set up for Programming-To-Go. A USB power source for the PICkit 2 is all that is needed.
標(biāo)簽： PROGRAMMER-TO PICKIT 8482
上傳時(shí)間： 2013-10-29
上傳用戶：ca05991270
This application note shows how to write an Inter Integrated Circuit bus driver (I²C) for the Philips P90CL301micro-controller.It is not only an example of writing a driver, but it also includes a set of application interface software routines toquickly implement a complete I²C multi-master system application.For specific applications the user will have to make minimal changes in the driver program. Using the drivermeans linking modules to your application software and including a header-file into the application sourceprograms. A small example program of how to use the driver is listed.The driver supports i.a. polled or interrupt driven message handling, slave message transfers and multi-mastersystem applications. Furthermore, it is made suitable for use in conjunction with real time operating systems, likepSOS+.
標(biāo)簽： routines driver P90 301
上傳時(shí)間： 2013-11-23
上傳用戶：weixiao99
All inputs of the C16x family have Schmitt-Trigger input characteristics. These Schmitt-Triggers are intended to always provide proper internal low and high levels, even if anundefined voltage level (between TTL-VIL and TTL-VIH) is externally applied to the pin.The hysteresis of these inputs, however, is very small, and can not be properly used in anapplication to suppress signal noise, and to shape slow rising/falling input transitions.Thus, it must be taken care that rising/falling input signals pass the undefined area of theTTL-specification between VIL and VIH with a sufficient rise/fall time, as generally usualand specified for TTL components (e.g. 74LS series: gates 1V/us, clock inputs 20V/us).The effect of the implemented Schmitt-Trigger is that even if the input signal remains inthe undefined area, well defined low/high levels are generated internally. Note that allinput signals are evaluated at specific sample points (depending on the input and theperipheral function connected to it), at that signal transitions are detected if twoconsecutive samples show different levels. Thus, only the current level of an input signalat these sample points is relevant, that means, the necessary rise/fall times of the inputsignal is only dependant on the sample rate, that is the distance in time between twoconsecutive evaluation time points. If an input signal, for instance, is sampled throughsoftware every 10us, it is irrelevant, which input level would be seen between thesamples. Thus, it would be allowable for the signal to take 10us to pass through theundefined area. Due to the sample rate of 10us, it is assured that only one sample canoccur while the signal is within the undefined area, and no incorrect transition will bedetected. For inputs which are connected to a peripheral function, e.g. capture inputs, thesample rate is determined by the clock cycle of the peripheral unit. In the case of theCAPCOM unit this means a sample rate of 400ns @ 20MHz CPU clock. This requiresinput signals to pass through the undefined area within these 400ns in order to avoidmultiple capture events.For input signals, which do not provide the required rise/fall times, external circuitry mustbe used to shape the signal transitions.In the attached diagram, the effect of the sample rate is shown. The numbers 1 to 5 in thediagram represent possible sample points. Waveform a) shows the result if the inputsignal transition time through the undefined TTL-level area is less than the time distancebetween the sample points (sampling at 1, 2, 3, and 4). Waveform b) can be the result ifthe sampling is performed more than once within the undefined area (sampling at 1, 2, 5,3, and 4).Sample points:1. Evaluation of the signal clearly results in a low level2. Either a low or a high level can be sampled here. If low is sampled, no transition willbe detected. If the sample results in a high level, a transition is detected, and anappropriate action (e.g. capture) might take place.3. Evaluation here clearly results in a high level. If the previous sample 2) had alreadydetected a high, there is no change. If the previous sample 2) showed a low, atransition from low to high is detected now.
標(biāo)簽： Signal Input Fall Rise
上傳時(shí)間： 2013-10-23
上傳用戶：copu
All inputs of the C16x family have Schmitt-Trigger input characteristics. These Schmitt-Triggers are intended to always provide proper internal low and high levels, even if anundefined voltage level (between TTL-VIL and TTL-VIH) is externally applied to the pin.The hysteresis of these inputs, however, is very small, and can not be properly used in anapplication to suppress signal noise, and to shape slow rising/falling input transitions.Thus, it must be taken care that rising/falling input signals pass the undefined area of theTTL-specification between VIL and VIH with a sufficient rise/fall time, as generally usualand specified for TTL components (e.g. 74LS series: gates 1V/us, clock inputs 20V/us).The effect of the implemented Schmitt-Trigger is that even if the input signal remains inthe undefined area, well defined low/high levels are generated internally. Note that allinput signals are evaluated at specific sample points (depending on the input and theperipheral function connected to it), at that signal transitions are detected if twoconsecutive samples show different levels. Thus, only the current level of an input signalat these sample points is relevant, that means, the necessary rise/fall times of the inputsignal is only dependant on the sample rate, that is the distance in time between twoconsecutive evaluation time points. If an input signal, for instance, is sampled throughsoftware every 10us, it is irrelevant, which input level would be seen between thesamples. Thus, it would be allowable for the signal to take 10us to pass through theundefined area. Due to the sample rate of 10us, it is assured that only one sample canoccur while the signal is within the undefined area, and no incorrect transition will bedetected. For inputs which are connected to a peripheral function, e.g. capture inputs, thesample rate is determined by the clock cycle of the peripheral unit. In the case of theCAPCOM unit this means a sample rate of 400ns @ 20MHz CPU clock. This requiresinput signals to pass through the undefined area within these 400ns in order to avoidmultiple capture events.
標(biāo)簽： C16x 微控制器 輸入信號(hào) 時(shí)序圖
上傳時(shí)間： 2014-04-02
上傳用戶：han_zh
This white paper discusses how market trends, the need for increased productivity, and new legislation have accelerated the use of safety systems in industrial machinery. This TÜV-qualified FPGA design methodology is changing the paradigms of safety designs and will greatly reduce development effort, system complexity, and time to market. This allows FPGA users to design their own customized safety controllers and provides a significant competitive advantage over traditional microcontroller or ASIC-based designs. Introduction The basic motivation of deploying functional safety systems is to ensure safe operation as well as safe behavior in cases of failure. Examples of functional safety systems include train brakes, proximity sensors for hazardous areas around machines such as fast-moving robots, and distributed control systems in process automation equipment such as those used in petrochemical plants. The International Electrotechnical Commission’s standard, IEC 61508: “Functional safety of electrical/electronic/programmable electronic safety-related systems,” is understood as the standard for designing safety systems for electrical, electronic, and programmable electronic (E/E/PE) equipment. This standard was developed in the mid-1980s and has been revised several times to cover the technical advances in various industries. In addition, derivative standards have been developed for specific markets and applications that prescribe the particular requirements on functional safety systems in these industry applications. Example applications include process automation (IEC 61511), machine automation (IEC 62061), transportation (railway EN 50128), medical (IEC 62304), automotive (ISO 26262), power generation, distribution, and transportation. 圖Figure 1. Local Safety System
標(biāo)簽： FPGA 安全系統(tǒng)
上傳時(shí)間： 2013-11-05
上傳用戶：維子哥哥
Then use Freescale’s InteractiveDevelopment Tool Ecosystem todesign a development processthat fulfills your specific needs.
標(biāo)簽： 飛思卡爾 開(kāi)發(fā)工具
上傳時(shí)間： 2013-10-26
上傳用戶：朗朗乾坤
The C8051F020/1/2/3 devices are fully integrated mixed-signal System-on-a-Chip MCUs with 64 digital I/O pins (C8051F020/2) or 32 digital I/O pins (C8051F021/3). Highlighted features are listed below; refer to Table 1.1 for specific product feature selection.
標(biāo)簽： C8051F020 數(shù)據(jù)手冊(cè)
上傳時(shí)間： 2013-11-08
上傳用戶：lwq11
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